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Panthera TEC MAT BA210 Model CCIS® Plan iASC objectives

SKU: 90107793750

4.6
USD2837.50 USD2867.50

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Ships within 48 hours · Estimated delivery Aug 3 - Aug 8

Description

Model CCIS® Plan iASC objectives 100x/1

The large zoom ratio of 6:1 and a standard working distance of 100mm provide the flexibility to support a large number of potential applications while the addition of an auxiliary lens or substitute eyepieces extend the magnification up to a maximum of 180X

Ergonomic Design: To support long-term laboratory or industrial work

lockable Circular rotating 360º

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Panthera TEC MAT BA210 Model CCIS® Plan iASC objectivesThe Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross Polarization contrast are combined with a new, unique to Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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